Carl Wayne Gray Genealogies

Baity, Arthur Leo

Baity, Arthur Leo

Male 1880 - 1962  (81 years)


Personal Information    |    Sources    |    Event Map    |    All    |    PDF

  • Name Baity, Arthur Leo 
    Birth 20 Feb 1880  Xenia, Clay County, Illinois Find all individuals with events at this location  [1, 2
    Gender Male 
    Reference Number BAIT.A010 
    Death 2 Jan 1962  [1, 2
    Burial Camp Ground Cemetery, Xenia, Clay County, Illinois Find all individuals with events at this location  [1
    Headstone, Baity, Arthur Leo
    Headstone, Baity, Arthur Leo
    Person ID I4096  Carl Wayne Gray Research | Graham - Hornick

    John Riley Graham and Rebecca Isabelle 'Bell' Hornick Descendants
    Last Modified 18 Feb 2021 

    Father Baity, Enos,   b. 27 Jul 1842, Xenia, Clay County, Illinois Find all individuals with events at this locationd. 24 Feb 1907, Xenia, Clay County, Illinois Find all individuals with events at this location (Age 64 years) 
    Mother Songer, Eliza Jane,   b. 20 Dec 1842, Xenia, Clay County, Illinois Find all individuals with events at this locationd. 26 May 1888 (Age 45 years) 
    Marriage 3 Feb 1867  [3
    Family ID F2430  Group Sheet  |  Family Chart

    Family Miller, Carrie Lois,   b. 1880   d. 1948 (Age 68 years) 
    Family ID F2481  Group Sheet  |  Family Chart

  • Event Map
    Link to Google MapsBirth - 20 Feb 1880 - Xenia, Clay County, Illinois Link to Google Earth
    Link to Google MapsBurial - - Camp Ground Cemetery, Xenia, Clay County, Illinois Link to Google Earth
     = Link to Google Earth 

  • Sources 
    1. [S1940] http://www.findagrave.com, Headstone, Baity, Arthur Leo, (http://www.findagrave.com/cgi-bin/fg.cgi?page=gr&GScid=105022&GRid=26535044&), none. (Reliability: 2).

    2. [S1211] Hashimoto, Nancy, Hashimoto, Nancy. E-mail to Carl Wayne Gray. 26 Feb. 1998. (Reliability: 2).

    3. [S14429] http://www.findagrave.com, Obituary, Baity, Enos, (https://www.findagrave.com/cgi-bin/fg.cgi?page=gr&GSln=Baity&GSiman=1&GScid=644287&GRid=19012171&), none. (Reliability: 2).